Title of the article

EXPERIMENTAL NANOMECHANICS. ATOMIC FORCE MICROSCOPY METHODS

Authors

Chizhik S.A., Institute of Heat and Mass Transfer Institute named after A.V. Lykov, NASB, Minsk, the Republic of Belarus, This email address is being protected from spambots. You need JavaScript enabled to view it.

In the section NANOMECHANICS
Year 2008 Issue 1 Pages 78-83
Type of article RAR Index UDK 621.3.049.77+621.385.833.2 Index BBK  
Abstract

Considered are atomic force microscopy methods concerning problems of experimental nanomechanics targeted on estimation of physical and mechanical properties of materials in nanovolumes and thin surface layers. Presented are examples of obtaining and interpretation of the contrast AFMimages that allow mapping of of local mechanical heterogeneity of nanostructured materials.

Keywords

Experimental nanomechanics, atomic force microscopy methods, nanostructured materials

   
Bibliography
  • Bhushan B. ed.Springer Handbook of Nanotechnology: library of Congress Cataloging-in-Publication. Berlin, Springer-Verlad Publ., 2004. 1222 p.
  • Golovin I.Ju. Vvedenie v nanotehniku [Introduction to nanotech]. Moscow, Mashinostroenie Publ., 2007.
  • Eleckij A.V. Mehanicheskie svojstva uglerodnyh nanostruktur i materialov na ih osnove [Mechanical properties of carbon nanostructures and materials on their basis]. Uspehi fizicheskih nauk [Progress of physical sciences], 2007, Vol. 117, no. 3, pp. 233-274.
  • Kravchuk, A.S., Karlyshkov S.V. Chislennoe modelirovanie deformacij i razrushenija na nanourovne [Numerical modeling of deformation and fracture at the nanoscale]. Vestnik SamGU. Estestvennonauch. ser. [Vestnik of SSU. The natural science series], 2007, no. 4 (54), pp. 209-229.
  • Panin V.E. Fizicheskaja mezomehanika i komp'juternoe konstruirovanie materialov [Physical mesomechanics and computer design of materials]. Novosibirsk, Nauka Publ., SB RAS, 1995, Vol. 1. 297 p.; Vol. 2. 317 p.
  • Sviridenok A.I., Chizhik S.A., Petrokovec M.I. Mehanika diskretnogo frikcionnogo kontakta [The mechanics of discrete friction contact]. Minsk, Navuka i tjehnika Publ., 1990. 272 p.
  • Bhushan B., Fuchs H., Hosaka S. Applied Scanning Probe Methods Springer, 2002. 475 p.
  • Suslov A.A., Chizhik S.A. Skanirujushhie zondovye mikroskopy [Scanning probe microscopes]. Materialy, tehnologii, instrument [Materials, technology, tools], 1997, no. 3, pp. 78-89.
  • Chizhik S.A. [et al.]. ASM NT-206 s funkciej nanotomografii. Bazovaja konstrukcija pribora [AFM NT-206 with nanotomografii function. The basic design of the device]. Katalog priborov, kompleksov i ustanovok, razrabotannyh po GNTP "Pribory dlja nauchnyh issledovanij" [Catalog of instruments, systems and installations, developed by SSTP “Research instruments”]. Minsk, 2006, pp. 35-40.
  • Binnig G., Rohrer H. Scanning tunneling microscopy. Helvetica Physica Acta 55, 1982. 726 p.
  • Binnig G., Quate C.F., Gerber Ch. Atomic force microscopy. Phys. Rev. Lett. 56 (9), 1986, pp. 930-933.
  • Ahn H.S., Chizhik S.A., Dubravin A.M. Atomno-silovaja mikroskopija poverhnosti trenija TiN [Atomic force microscopy TiN surface friction]. Trenie i iznos [Friction and Wear], 1999, Vol. 20, no. 6, pp. 1-10.
  • Chizhik S.A., Dubravin A.M., Ahn H.S. Analiz poverhnostej tverdyh materialov s pomoshh'ju izobrazhenij fazovogo kontrasta [Analysis of the solid surfaces of materials using phase contrast images]. Skanirujushhaja zondovaja mikroskopija 2000 [Scanning probe microscopy 2000]. Nizhnij Novgorod, 2000, pp. 91-96.
  • Shasholko D.I., Suslov A.A., Chizhik S.A. Joint analysis of topography and contrast SPM images with the software package SurfaceView. Proc. Int. Workshop “Scanning Probe Microscopy - 2002”, Nizhny Novgorod, 2002, pp. 252-254.
  • Ahn H.S. [et al.]. Application of phase contrast imaging atomic force microscopy to tribofilms on DLC coatings. Wear 249, 2001, pp. 617-625.
  • Magonov S.N., Elings V., Whangbo M.H. Phase imaging and stiffness in tapping-mode atomic force microscopy. Surf. Sci. Lett., 1997.
  • Tamayo J., Garc R. Effects of elastic interactions on phase contrast images in tapping-mode scanning force microscopy. Appl. Phys. Lett., 1997.
  • Burnham N., Colton R.J. Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope. J.Vac. Sci. Technol., 1989.